Advantest Corp. has introduced high-speed, high-throughput memory test systems for Multi-Chip Packages (MCPs).
The T5781 test system offers high test speeds of 533-Mbits/s for next-generation MCPs, devices that combine multiple memory types, including NAND, NOR and DRAM, in a single package.
Complementing the T5781 is the T5781 Engineering Station (T5781ES), which is designed for device evaluation and test program development in a developmental/laboratory environment.
Advantest's T5781 memory test systems test speeds of up to 266-MHz/533-Mbits/s (in DDR mode). Advantest designed the T5781/T5781ES to incorporate functions to test all memory types in an MCP on a single test system.
The test systems employ a tester-per-site architecture to efficiently test NAND flash memory. With test resources at each test site, including power sources and per-pin logic and ALPG functionality, devices can be individually controlled and tested. By making the test functions independent through tester-per-site architecture, the test time for NAND and SPI flash memory is reduced.
System shipments began in October. Pricing is available upon request. |
